AT27C512 25DM 883 by Atmel Corporation - Receive a Competitive Quote
Part Number: AT27C512 25DM 883 | Alternate P/N: AT27C51225DM883 | Manufacturer: Atmel Corporation | NSN : 5962-01-326-2822 | Item Name : Microcircuit Memory | CAGE Code: 1FN41 | FSC : 5962 Microcircuits Electronic | ||
We’re excited to announce that AT27C512 25DM 883 NSN part is now available and ready for immediate shipping. Part number AT27C512 25DM 883 is a Microcircuit Memory manufactured by Atmel Corporation with NSN 5962013262822. Are you interested in a quick and competitive quote for this part?
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NSN Information for Part Number AT27C512 25DM 883 with NSN 5962-01-326-2822, 5962013262822
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-326-2822 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013262822 | N | B | ||
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
B | A | 0 | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
5962-8764803XA | 2 | 1 | 5 |
Characteristics Data of NSN 5962-01-326-2822, 5962013262822
MRC | Criteria | Characteristic |
---|---|---|
ABKW | OVERALL HEIGHT | 0.432 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
CQZP | INPUT CIRCUIT PATTERN | 18 INPUT |
CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
CSWJ | WORD QUANTITY | 65536 |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
ADAU | BODY HEIGHT | 0.172 INCHES MINIMUM AND 0.217 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 825.0 MILLIWATTS |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-10 MIL-M-38510 |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 14.0 VOLTS MAXIMUM POWER SOURCE |
ADAQ | BODY LENGTH | 1.490 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | 55.0/125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | 65.0/150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | ULTRAVIOLET ERASABLE AND MONOLITHIC AND PROGRAMMABLE AND W/BUFFERED OUTPUT AND W/ENABLE AND ELECTROSTATIC SENSITIVE |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CZER | MEMORY DEVICE TYPE | ROM |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CRHL | BIT QUANTITY | 524288 |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
FEAT | SPECIAL FEATURES | NUCLEAR HARDNESS CRITICAL ITEM |