NSN 6625-00-504-1949 of Test Set Semiconduc - Product Details
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| Alternative NSN: 6625-00-504-1949 |
| Item Name:Test Set Semiconduc |
| FSG: 66 Instruments and Laboratory Equipment |
| Federal Supply Class (FSC): 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
| NIIN: 005041949 |
| NCB Code: USA (00) |
| Manufacturers: Edo Corp |
Manufacturer's List for NSN 6625-00-504-1949, 6625005041949
Part Number Related To NSN 6625-00-504-1949, 6625005041949
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 390A3 | 6625-00-504-1949 | test set semiconduc | Avl | RFQ |
| 390A | 6625-00-504-1949 | test set semiconduc | Avl | RFQ |
| 39013 | 6625-00-504-1949 | test set semiconduc | Avl | RFQ |
Characteristics Data of NSN 6625005041949
| MRC | Criteria | Characteristic |
|---|---|---|
| HGTH | HEIGHT | 3.000 INCHES NOMINAL |
| ANNQ | MATERIAL AND LOCATION | ALUMINUM CARRYING CASE |
| ACYR | DC VOLTAGE RATING | 1.5 VOLTS NOMINAL |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TO MEASURE THE RELATIVE NOISE FIGURE OF MICROWAVE MIXER CRYSTALS,TO OBTAIN AN APPROXIMATE IMPEDANCE CHECK FOR SELECTING MATCHED CRYSTALS,FOR USE IN BALANCE MIXERS,TO MEASURE THE RELATIVE SENSITIVITY OF MICROWAVE DETECTOR CRYSTALS |
| ABGL | WIDTH | 6.000 INCHES NOMINAL |
| ABRY | LENGTH | 6.000 INCHES NOMINAL |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| FEAT | SPECIAL FEATURES | ACCEPTS CERAMIC CARTRIDGE AND COAXIAL TYPES OF BOTH NORMAL AND REVERSED POLARITIES; REMOTE TEST JACK PERMITS TESTING CRYSTALS W/O REMOVING THEM FROM RECEIVER |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| AQXZ | OPERATING TEST CAPABILITY | SILICON MIXER CRYSTALS,RANGE 0 TO 10000 MC,PORM 1/2 DB ON CONVERSION LOSS,PORM 0.5 DB ON NOISE TEMP |
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