NSN 5962-01-513-1109 of Microcircuit Memory - Product Details
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| Alternative NSN: 5962-01-513-1109 |
| Item Name:Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 015131109 |
| NCB Code: USA (01) |
| Manufacturers: Integrated Device Technology Inc |
Manufacturer's List for NSN 5962-01-513-1109, 5962015131109
Part Number Related To NSN 5962-01-513-1109, 5962015131109
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| IDT72615L25GM | 5962-01-513-1109 | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962015131109
| MRC | Criteria | Characteristic |
|---|---|---|
| CQSZ | INCLOSURE CONFIGURATION | PIN GRID ARRAY |
| CBBL | FEATURES PROVIDED | BIDIRECTIONAL AND LOW POWER AND HIGH SPEED AND SYNCHRONOUS |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM INPUT |
| CZZZ | MEMORY CAPACITY | 512K X 18 BIT |
| TTQY | TERMINAL TYPE AND QUANTITY | 68 PIN |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCUIT DIGITAL-CEMOS PARALLEL SYNC BIFIFO, (512 X 18 BIT), 25 NS ACCESS |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CZER | MEMORY DEVICE TYPE | FIRST-IN FIRST-OUT |
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