NSN 6625-00-222-1117 of Test Set Semiconduc - Product Details
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| Alternative NSN: 6625-00-222-1117 |
| Item Name:Test Set Semiconduc |
| FSG: 66 Instruments and Laboratory Equipment |
| Federal Supply Class (FSC): 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
| NIIN: 002221117 |
| NCB Code: USA (00) |
| Manufacturers: Harris Corp , Joint Electronics Type Designation , Itt Corp |
Manufacturer's List for NSN 6625-00-222-1117, 6625002221117
Part Number Related To NSN 6625-00-222-1117, 6625002221117
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| TS-3253-TPM-39 | 6625-00-222-1117 | test set semiconduc | Avl | RFQ |
| TS-3253-TPM-39 | 6625-00-222-1117 | test set semiconduc | Avl | RFQ |
| 5999965 | 6625-00-222-1117 | test set semiconduc | Avl | RFQ |
| 5999965 | 6625-00-222-1117 | test set semiconductor device | Avl | RFQ |
| 5999965 | 6625-00-222-1117 | test set semiconduc | Avl | RFQ |
Characteristics Data of NSN 6625002221117
| MRC | Criteria | Characteristic |
|---|---|---|
| ZZZV | Fsc Application Data | TEST SET,ELECT. EQUIP. |
| ANNQ | Material And Location | ALUMINUM HOUSING |
| MRC | Decoded Requirement | Clear Text Reply |
| HGTH | Height | 3.880 INCHES NOMINAL |
| AKWA | Joint Electronics Type Designation System Item Name | TEST SET,SEMICONDUCTOR DEVICE |
| AKWB | Joint Electronics Type Designation System Item Type Number | TS-3253/TPM-39 |
| ANPZ | Inclosure Feature | SINGLE ITEM W/HOUSING |
| ABGL | Width | 4.250 INCHES NOMINAL |
| AQXY | Test Type For Which Designed | MICROWAVE DIODE CURRENT |
| SFTT | Surface Treatment | ENAMEL |
| AQXZ | Operating Test Capability | MICROAMPHERE METER RANGE 0-1000 UA DC |
| ABRY | Length | 5.500 INCHES NOMINAL |
Get More Relevant NSN for NSN 6625-00-222-1117, 6625002221117
