NSN 5962-01-362-3539 of Microcircuit Memory - Product Details
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Alternative NSN: 5962-01-362-3539 |
Item Name:Microcircuit Memory |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 013623539 |
NCB Code: USA (01) |
Manufacturers: Omni Wave Semiconductor Corp , Dla Land And Maritime , Integrated Device Technology Inc , Military Specifications , Austin Semiconductor Inc |
Manufacturer's List for NSN 5962-01-362-3539, 5962013623539
omni wave semiconductor corp | dla land and maritime | integrated device technology inc |
military specifications | austin semiconductor inc |
Part Number Related To NSN 5962-01-362-3539, 5962013623539
Part No | NSN | Item Name | QTY | RFQ |
---|---|---|---|---|
0W62256CD3-45 | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
5962-88662 | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
5962-8866204XA | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
5962-8866204XB | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
5962-8866204XX | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
IDT71256S35DB | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
IDT71256S45D | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
IDT71256S45DB | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
M38510/29308BXA | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
MT5C2568CW-45883C | 5962-01-362-3539 | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962013623539
MRC | Criteria | Characteristic |
---|---|---|
ADAT | BODY WIDTH | 0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-10 MIL-M-38510 |
CTQX | CURRENT RATING PER CHARACTERISTIC | 150.00 MILLIAMPERES MAXIMUM SUPPLY |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
ADAU | BODY HEIGHT | 0.217 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND STATIC OPERATION |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 26 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEP | CAPITANCE RATING PER CHARACTERISTIC | 11.00 INPUT PICOFARADS MAXIMUM AND 11.00 OUTPUT PICOFARADS MAXIMUM |
CZEQ | TIME RATING PER CHACTERISTIC | 45.00 NANOSECONDS MAXIMUM ACCESS |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC |
ADAQ | BODY LENGTH | 1.490 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | 55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | 65.0 TO 150.0 DEG CELSIUS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CZER | MEMORY DEVICE TYPE | RAM |