NSN 5962-01-314-9189 of Microcircuit Memory - Product Details
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| Alternative NSN: 5962-01-314-9189 |
| Item Name:Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 013149189 |
| NCB Code: USA (01) |
| Manufacturers: Sertech Laboratories Inc , Stellar Technology Inc , Massachusetts Components Inc , Freescale Semiconductor Inc , Fairchild Semiconductor Corp , Advanced Micro Devices Inc , Raytheon Company |
Manufacturer's List for NSN 5962-01-314-9189, 5962013149189
| sertech laboratories inc | stellar technology inc | massachusetts components inc |
| freescale semiconductor inc | fairchild semiconductor corp | advanced micro devices inc |
| raytheon company |
Part Number Related To NSN 5962-01-314-9189, 5962013149189
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 93L422 | 5962-01-314-9189 | microcircuit memory | Avl | RFQ |
| 93L422 | 5962-01-314-9189 | microcircuit memory | Avl | RFQ |
| 93L422 | 5962-01-314-9189 | microcircuit memory | Avl | RFQ |
| 93L422 | 5962-01-314-9189 | microcircuit memory | Avl | RFQ |
| 93L422 | 5962-01-314-9189 | microcircuit memory | Avl | RFQ |
| 93L422 | 5962-01-314-9189 | microcircuit memory | Avl | RFQ |
| G101960-863 | 5962-01-314-9189 | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962013149189
| MRC | Criteria | Characteristic |
|---|---|---|
| AEHX | MAXIMUM POWER DISSIPATION RATING | 495.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | 55.0 TO 125.0 DEG CELSIUS |
| CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
| CQZP | INPUT CIRCUIT PATTERN | 16 INPUT |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
| CZER | MEMORY DEVICE TYPE | RAM |
| TTQY | TERMINAL TYPE AND QUANTITY | 28 LEADLESS |
| CZEQ | TIME RATING PER CHACTERISTIC | 75.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 75.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT |
| AFJQ | STORAGE TEMP RANGE | 65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND BURN IN AND MONOLITHIC |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC |
Get More Relevant NSN for NSN 5962-01-314-9189, 5962013149189
