NSN 5962-01-304-1296 of Microcircuit Memory - Product Details
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| Alternative NSN: 5962-01-304-1296 |
| Item Name:Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 013041296 |
| NCB Code: USA (01) |
| Manufacturers: Ocean Technology Inc , Chemtech Ltd , Military Specifications , Dla Land And Maritime |
Manufacturer's List for NSN 5962-01-304-1296, 5962013041296
Part Number Related To NSN 5962-01-304-1296, 5962013041296
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 22540-013 | 5962-01-304-1296 | microcircuit memory | Avl | RFQ |
| 22540-13 | 5962-01-304-1296 | microcircuit memory | Avl | RFQ |
| 22540-13 | 5962-01-304-1296 | microcircuit memory | Avl | RFQ |
| M38510/21002BJA | 5962-01-304-1296 | microcircuit memory | Avl | RFQ |
| ROM PROM FAMILY 029 | 5962-01-304-1296 | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962013041296
| MRC | Criteria | Characteristic |
|---|---|---|
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CZZZ | MEMORY CAPACITY | UNKNOWN |
| ADAT | BODY WIDTH | 0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.150 INCHES MINIMUM AND 0.210 INCHES MAXIMUM |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND PROGRAMMABLE AND SCHOTTKY AND W/ACTIVE PULL-UP |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| ADAQ | BODY LENGTH | 1.290 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.02 WATTS |
| AFGA | OPERATING TEMP RANGE | 55.0/125.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| AFJQ | STORAGE TEMP RANGE | 65.0/150.0 DEG CELSIUS |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
| CZEQ | TIME RATING PER CHACTERISTIC | 100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | ROM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC |
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