NSN 5962-01-299-6402 of Microcircuit Digita - Product Details
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| Alternative NSN: 5962-01-299-6402 |
| Item Name:Microcircuit Digita |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 012996402 |
| NCB Code: USA (01) |
| Manufacturers: Texas Instruments Inc , Freescale Semiconductor Inc , Selex Es Limited , Aero Systems Engineering Inc |
Manufacturer's List for NSN 5962-01-299-6402, 5962012996402
Part Number Related To NSN 5962-01-299-6402, 5962012996402
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| SNJ54HC574J | 5962-01-299-6402 | microcircuit digita | Avl | RFQ |
| MC74HC574N | 5962-01-299-6402 | microcircuit digita | Avl | RFQ |
| 165764-0000 | 5962-01-299-6402 | microcircuit digita | Avl | RFQ |
| 104312-001 | 5962-01-299-6402 | microcircuit digita | Avl | RFQ |
Characteristics Data of NSN 5962012996402
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 0.930 INCHES MINIMUM AND 0.975 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.180 INCHES MAXIMUM |
| AFJQ | STORAGE TEMP RANGE | 65.0 TO 150.0 DEG CELSIUS |
| AGAV | END ITEM IDENTIFICATION | 4920-01-187-4068 TEST SYSTEM,AUT |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CZEQ | TIME RATING PER CHACTERISTIC | 400.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 400.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND HIGH SPEED AND 3-STATE OUTPUT AND W/CLOCK |
| CSSL | DESIGN FUNCTION AND QUANTITY | 8 FLIP-FLOP,EDGE TRIGGERED,D-TYPE |
| ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | 55.0 TO 125.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQZP | INPUT CIRCUIT PATTERN | 10 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| TTQY | TERMINAL TYPE AND QUANTITY | 20 PRINTED CIRCUIT |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC |
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