NSN 5962-01-298-2146 of Microcircuit Memory - Product Details
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| Alternative NSN: 5962-01-298-2146 |
| Item Name:Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 012982146 |
| NCB Code: USA (01) |
| Manufacturers: Advanced Micro Devices Inc , Raytheon Company , Raytheon Co Equipment Development , Dla Land And Maritime |
Manufacturer's List for NSN 5962-01-298-2146, 5962012982146
Part Number Related To NSN 5962-01-298-2146, 5962012982146
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| AM27S27DMB | 5962-01-298-2146 | microcircuit memory | Avl | RFQ |
| G111283-332 | 5962-01-298-2146 | microcircuit memory | Avl | RFQ |
| G11283-332 | 5962-01-298-2146 | microcircuit memory | Avl | RFQ |
| G395810-1 | 5962-01-298-2146 | microcircuit memory | Avl | RFQ |
| ROM PROM FAMILY 121 | 5962-01-298-2146 | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962012982146
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 1.055 INCHES MINIMUM AND 1.110 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.280 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.115 INCHES MINIMUM AND 0.140 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | 55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | 65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | SCHOTTKY AND PROGRAMMED AND HIGH RELIABILITY AND W/CLOCK AND ASYNCHRONOUS AND MONOLITHIC |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 12 INPUT |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 185.00 MILLIAMPERES NOMINAL SUPPLY |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CZEP | CAPITANCE RATING PER CHARACTERISTIC | 5.00 INPUT PICOFARADS MAXIMUM AND 12.00 OUTPUT PICOFARADS MAXIMUM |
| CZEQ | TIME RATING PER CHACTERISTIC | 65.00 NANOSECONDS MAXIMUM ACCESS |
| CZER | MEMORY DEVICE TYPE | PROM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC |
| TTQY | TERMINAL TYPE AND QUANTITY | 22 PRINTED CIRCUIT |
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