NSN 5962-01-217-4206 of Microcircuit Memory - Product Details
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| Alternative NSN: 5962-01-217-4206 |
| Item Name:Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 012174206 |
| NCB Code: USA (01) |
| Manufacturers: Nec Electronics Usa Inc Electron , Fluke Corporation , Dla Land And Maritime |
Manufacturer's List for NSN 5962-01-217-4206, 5962012174206
Part Number Related To NSN 5962-01-217-4206, 5962012174206
| Part No | NSN | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 23128 | 5962-01-217-4206 | microcircuit memory | Avl | RFQ |
| 650747 | 5962-01-217-4206 | microcircuit memory | Avl | RFQ |
| 707182 | 5962-01-217-4206 | microcircuit memory | Avl | RFQ |
| 819474 | 5962-01-217-4206 | microcircuit memory | Avl | RFQ |
| 8202502YB | 5962-01-217-4206 | microcircuit memory | Avl | RFQ |
| 9000A-9051 | 5962-01-217-4206 | microcircuit memory | Avl | RFQ |
| ROM/PROM | 5962-01-217-4206 | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962012174206
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 1.300 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.520 INCHES NOMINAL |
| ADAU | BODY HEIGHT | 0.205 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | 25.0 TO 75.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | 65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | PROGRAMMABLE AND MONOLITHIC AND ULTRAVIOLET ERASABLE |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
| CRHL | BIT QUANTITY | 131072 |
| CSWJ | WORD QUANTITY | 16384 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 0.5 VOLTS MAXIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CZEQ | TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | ROM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC |
| TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
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